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PNIASIC

Specifications

Electrical Specifications

Parameter voltage and current levels

Testing for the currents listed in

Table 4 assume a static test setup with measurements performed while

static data is applied to the device. Test type parameters apply as listed in the

Table 8: Pin Definitions

Table 4: Inputs

Test Type Vil

Vih

Iil

Iih

AIB (analog input) 0.2 Vdd 2.0 Vdd 0.0 to -1.0 µA 0.0 to 1.0 µA

IBA (CMOS) 0.25 Vdd 0.8 Vdd 0.0 to -1.0 µA 0.0 to 1.0 µA

IBT (CMOS, SC

Hsy = 1.0)

0.2 Vdd 0.8 Vdd 0.0 to -1.0 µA 0.0 to 1.0 µA

a. CMOS values are V

x V

b. Iil and Iih are tested at V

= 3.6 V. Not tested at less than room temperature.

c. SC = Schmitt

Table 5: Outputs

Test Type Vol Voh Iol

Ioh

OB 1

<0.4 V >2.4 V 1.0 mA minimum -1.0 mA minimum

OB 2

<0.4 V >2.4 V 1.0 mA minimum -1.0 mA minimum

OB 3

0.267 V 1.936 V 10 mA minimum 10 mA minimum

a. Polarity on currents indicate direction of current ( + ) for sinking ( - ) for sourcing.

b. V

= 4.5 to 5.0 V

c. V

= 2.2 V

Table 6: I/O Pins

Test

Type

Vil

Vih

Vol

Voh

Iol

Ioh

Ioz

IO1A

CMOS

<.30 V >.70V <0.40 V 4.1 V -0.64 mA -0.15 mA 39µA

minimum

217 µA

maximum

a. CMOS values are V

x V

b. Tested at V

= 4.8 V

c. Tested with V

= 5.2 V. Leakage on I/O pins is typically checked for ± 2 µA with the ouput device turned off and no

PU or PD.

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Forthemostcurrentspecifications,pleasevisitourwebsiteat:www.pnicorp.com

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